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Experimental Techniques in Nanotechnology
Paper Code:
PHY-143 (D)
Credits:
4
Contact Hours:
60.00
Max. Marks:
100.00
Objective:
The aim of this course is to provide a general and broad introduction to the field of nanotechnology. During the course students will acquire the basic knowledge of the physical phenomena, theoretical concepts and experimental techniques behind the recent vastly improved ability to observe, fabricate and manipulate individual structures on the nanometer scale.
Course Outcome: On completion of the course, the student will be able to:
• Introduce the quantum mechanical aspects of nanotechnology
• Understanding nucleation, growth and phase transformation kinetics
• Comprehensive discussion on various methods of material Synthesis
• To Understand about different analysis techniques
14.00
Unit I:
I
Introduction to Quantum Mechanics: Electron Confinement, Particle in a box, Particle in a Coulomb Potential, Tunneling of a particle through Potential Barrier, Density of states for zero, one, two and three dimensional materials, Quantum confinement, Various factors depending on the particle size, Excitons, Idea of quantum well structure, quantum dots, quantum wires. Electronic conduction mechanism in nanoparticles.
12.00
Unit II:
II
Synthesis of Nanomaterials -I: Physical Methods- High Energy Ball Milling, Melt Mixing, Physical Vapour Deposition, Ionized Cluster Beam Deposition, Laser Ablation, DC and RF Sputtering, Magnetron Sputtering, ECR Plasma Deposition, Ion Beam Techniques, Molecular Beam Epitaxy.
10.00
Unit III:
III
Synthesis of Nanomaterials-II: Chemical Method- Colloids and colloids in solution, Nucleation and growth of Nanoparticles, Synthesis of metal and semiconductor nanoparticles by colloidal route,Langmuir-Blodgett method, Microemulsions, Sol-Gel method.
12.00
Unit IV:
IV
Analysis Techniques I: Diffraction Techniques- X-Ray Diffraction (XRD), Microscopy-Optical and Confocal Microscopy, Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Scanning Probe Microscopy (SPM), Atomic Force Microscope (AFM).
12.00
Unit V:
V
Analysis Technique -II: Spectroscopy- Optical Absorption Spectrometer, Infrared Spectrometer, Dispersive Infrared Spectrometer, Fourier Transform Infrared Spectrometer (FTIR), Raman Spectroscopy, Photoluminescence Spectrometer, X-Ray Photoelectron Spectrometer (XPS), Auger Electron Spectroscopy.
References:
1. Nanotechnology: Principle and Practices, S.K. KulKarni, Capital Publishing Company (2015).
2. Introduction To Nanoscience And Nenotechnology, K. K. Chattopadhyay, A. N. banerjee, PHI Learning Private limited (2009).
3. Introduction to Solid State Physics, Charles Kittle, Wiley-India Edition (2008).
4. Physics of Semiconductor Nanostructures, K. P. Jain, Narosa Publishers (1997).
5. Quantum Dot Hetrostructures, D.M. Garundmann and N.N.Ledentsov, John-Wiley (1998) .
6. Introduction to Nanotechnology, C. P. Poole, F. J. Owens, Wiley-Interscience (2003).
7. Nanotechnology: Basic Science & Emerging Technologies, M. Wilson, K. Kannangara, G. Smith, M. Simmons and B. Raguse, Chapman & Hall/CRC Press (2002).
8. Nanostructure and Nanomaterials:Synthesis, Properties and Applications, G. Cao and Ying Wang, World Scientific Publishing (2011)
9. Nanoparticles and Nanostructured Films: Preparation, Characterization and Applications, Janos H. Fendler, Wiley (1998).
Academic Year:
